Spectrum analyzers are expensive pieces of equipment that should be handled with care, especially when it involves applying signals to the RF input. Some new users may not know what “care” means and how to go about ensuring the spectrum analyzer they’re using is protected from overloading and damage.
This article briefly describes why it's important to consider what RF suppression/filtering techniques will be applied to your product as early in the design process as possible.
This article briefly describes the most important pre-layout elements to look for when selecting a SI/PI software simulation package.
A basic knowledge of the probe types and their performance capabilities is important because their operation can affect the whole system under test and measurement results obtained.
Sometimes we can get stuck in our careers, doing the same things over and over again, day in and day out. One way we can break free from this situation and improve our cognitive abilities is to continue to study and learn new things – even subjects outside of what might be considered our chosen specialty.
It’s imperative for successful completion of a testing project that as a compliance engineer or technician leading a product certification effort, you trust but verify the work of testing facilities.
Antennas used for EMC testing possess several characteristics which make them ideal for use in a fast-paced, production-like EMC test environment. This article will briefly describe what these characteristics are, starting with the most important parameter – antenna factor.
If you have to purchase an ESD Simulator, you might as well get as much mileage out of it as you can, right?
You’re an expert at EMC testing but, when it comes to installing, tearing down, and moving an EMC chamber, you may not have a clear understanding of all of the non-engineering tasks that go along with such an important event.
There has to be a better way of specifying EMI filter performance – one that shows a filter’s effectiveness in real-life situations. It turns out there is a better alternative test method that fulfills this need. This method is the insertion loss test method for non-50Ω systems, located in Annex C of the second edition of EN 55017 (a.k.a. CISPR 17).