Resistance

Part II of this two-article series focuses on log-periodic and biconical antenna impedance, VSWR, and radiated emissions measurements.

CDM discharges exhibit a fast initial current step when the stray capacitance of the pogo pin is charged. It is demonstrated that the high slew rate can damage sensitive gate oxides. The miscorrelation of CDM and CC-TLP methodologies is addressed by applying pulses with 20 ps rise time.

In the past six months, EOS/ESD Association, Inc. released eight new or revised documents on electrical overstress (EOS), grounding, packaging materials, seating (chairs), footwear, hand tools, gloves, and human metal model.

Are you just getting into software simulation and feeling a little overwhelmed with all the new jargon? This brief article will explain some of the most common terms used in the very exciting world of EMC/Signal Integrity simulation software, all in one location.

Answering the needs of managing EMI in actual use, this article provides hands-on guidance to specialists at the factories and elsewhere on measuring conducted EMI where it matters – in their environment. Anyone who knows how to use an oscilloscope can perform such measurements.