Probe

CDM discharges exhibit a fast initial current step when the stray capacitance of the pogo pin is charged. It is demonstrated that the high slew rate can damage sensitive gate oxides. The miscorrelation of CDM and CC-TLP methodologies is addressed by applying pulses with 20 ps rise time.

Ever tried to measure low-level signals in the presence of noise? Or wanted to capture a measurement isolated from ground, like that of an ungrounded hand-held digital multi-meter, but also needed to capture finer details of the signal, like those captured with an oscilloscope?

Answering the needs of managing EMI in actual use, this article provides hands-on guidance to specialists at the factories and elsewhere on measuring conducted EMI where it matters – in their environment. Anyone who knows how to use an oscilloscope can perform such measurements.

This article discusses the common-mode and differential-mode radiation from cables and presents the measurement results from the SMPS connecting wires.