Probe

The electronic industry has embraced simulation to address several complex design challenges, but reliability is still mostly dealt with best design practices and tested with prototypes. In this article, we present how modeling and simulation approaches can help designers perform virtual prototyping and uncover reliability issues especially EOS/ESD before going for physical prototypes.

CDM discharges exhibit a fast initial current step when the stray capacitance of the pogo pin is charged. It is demonstrated that the high slew rate can damage sensitive gate oxides. The miscorrelation of CDM and CC-TLP methodologies is addressed by applying pulses with 20 ps rise time.

This article discusses additional requirements that designers and safety professionals may want to consider beyond the base standard for their product based on the environment and user exposure.

We are all aware of TVs and radios being affected by vacuum cleaners, food mixers, mobile phones, and the like...