Noise

In Part 1 of this two-part article, we’ll discuss the development of “grounding networks” and the shift to meshed structures to reduce damage from overvoltages. Part 2 will appear in our November 2020 issue.

CDM discharges exhibit a fast initial current step when the stray capacitance of the pogo pin is charged. It is demonstrated that the high slew rate can damage sensitive gate oxides. The miscorrelation of CDM and CC-TLP methodologies is addressed by applying pulses with 20 ps rise time.

Optical communication can dramatically increase the bandwidth between servers while reducing complexity, power consumption, and cost.

The regular “Banana Skins” column was published in the EMC Journal, starting in January 1998.

Firmware is integral to the operation of most devices, and may represent an easier and less expensive pathway for addressing EMC issues. This article presents different approaches to modifying firmware as well as case studies illustrating the potential effectiveness of this approach.