Mismatch

Tin whiskers are small, hair-like structures that can form naturally from the surface of tin components. This article explores potential contributors to tin whisker growth, failure mechanisms that may be induced by whiskers, current testing standards and processes, and mitigation strategies, with a particular focus on the automotive industry.

CDM discharges exhibit a fast initial current step when the stray capacitance of the pogo pin is charged. It is demonstrated that the high slew rate can damage sensitive gate oxides. The miscorrelation of CDM and CC-TLP methodologies is addressed by applying pulses with 20 ps rise time.

This article presents the fundamentals and application of capacitors. What is a capacitor, and how do we select them? Techniques of selecting capacitors and things to consider when using capacitors are highlighted. Both practical examples and simulation are used to demonstrate the key points.

Don’t overlook the fact that EMI filters can be used to prevent unwanted RF noise (such as electrical fast transient burst, conducted RF, and some surges) from entering susceptible devices.

This article discusses the requirements for the qualification of an Open Area Test Site or Semi Anechoic Chamber for measuring radiated disturbances from 30 MHz to 1 GHz.