Inductance

CDM discharges exhibit a fast initial current step when the stray capacitance of the pogo pin is charged. It is demonstrated that the high slew rate can damage sensitive gate oxides. The miscorrelation of CDM and CC-TLP methodologies is addressed by applying pulses with 20 ps rise time.

Changes to the FCC compliance rules in the U.S. now enable manufacturers to save time and cost by allowing self-testing. This article outlines some of the basic factors that determine RF and EMC behavior and how these determine compliance test methods.

Answering the needs of managing EMI in actual use, this article provides hands-on guidance to specialists at the factories and elsewhere on measuring conducted EMI where it matters – in their environment. Anyone who knows how to use an oscilloscope can perform such measurements.

Are you just getting into software simulation and feeling a little overwhelmed with all the new jargon? This brief article will explain some of the most common terms used in the very exciting world of EMC/Signal Integrity simulation software, all in one location.

This article presents the importance of defining product case and load simulator grounding in an automotive EMC test plan.