Diode

Optical communication can dramatically increase the bandwidth between servers while reducing complexity, power consumption, and cost.

The electronic industry has embraced simulation to address several complex design challenges, but reliability is still mostly dealt with best design practices and tested with prototypes. In this article, we present how modeling and simulation approaches can help designers perform virtual prototyping and uncover reliability issues especially EOS/ESD before going for physical prototypes.

As the global market for LED horticultural luminaires grows, it is important for the industry to assess these products for safety and performance considerations unique to their controlled indoor agricultural environments. The industry is responding by introducing standards and programs with a variety of requirements.

This article reviews some of the ESD protection design challenges when designing in a FinFET technology and give an outlook on the successors of FinFET.

CDM discharges exhibit a fast initial current step when the stray capacitance of the pogo pin is charged. It is demonstrated that the high slew rate can damage sensitive gate oxides. The miscorrelation of CDM and CC-TLP methodologies is addressed by applying pulses with 20 ps rise time.