Gun Test of a USB3 Host Controller Board

System level tests on a USB3 controller with on-board protection were found to yield irreproducible failure levels. A root cause analysis was performed using a combination of gun tests, TLP tests, and SEED simulation. It was found that an inductive current distribution between protection and SoC may explain the actual failure levels. Solutions are presented for effective on-board protection of USB3 controller boards.

Fist Bumps and Germs

Barack Obama, the Dalai Lama and hip hop musicians might have discovered the key to avoiding the spread of germs. According to a study published in a recent issue of the American Journal of Infection Con... Read More...