theo smedes

Industry Council’s Latch‑up Survey

This article provides a high-level overview of the Industry Council paper “Survey on Latch‑up Testing Practices and Recommendations for Improvements,” which describes the full analysis of the collected responses and lays a path for potential adaptations needed to accommodate its use in future technologies and applications.

Transmission Line Pulse Testing: The Indispensable Tool for ESD Characterization of Devices, Circuits and Systems

Transmission Line Pulse testing is the default method for characterizing the behavior of devices under ESD circumstances.

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