testing

Fully anechoic rooms (or FARs) are now included as certified test sites in the generic standard CISPR 16-1-4 Ed 3.2. Although limitations exist for floor standing equipment, they significantly reduce cost and facility requirements for many products.

Consider a spherical capacitor consisting of two concentric, conducive spheres separated by a dielectric.

This article documents the role of margin demonstration in system-level EMC testing: how and why they were first instituted, and how they have evolved over time.

This article will define the test requirements, and discuss the methods used to obtain results. Limitations of the equipment used will also be discussed, so that lab personnel can be made aware and do their best to minimize tolerance errors.

Why are home use medical and wellness devices drawing so much attention and growing at an explosive rate?

Quite often, we are asked about the most common deficiencies that are cited by assessors during A2LA assessments to ISO/IEC 17025:2005.

The leakage current measuring circuits in IEC 950 and those in North America are exactly the same.

Although the foundation of a failure analysis is rooted in science, there is also an art to completing one, successfully. The path from “problem discovery” to “problem solution” has many bumps and twists along the way and this article will hopefully help guide you on your journey.

International regulations addressing radiofrequency identification (RFID) devices may seem as endless and evolving as applications for the technology itself.

Today’s fast-paced, high-growth electronics market requires electromagnetic compliance (EMC) test facilities to develop shorter product test cycles while maintaining test accuracy.