This article will define the test requirements, and discuss the methods used to obtain results. Limitations of the equipment used will also be discussed, so that lab personnel can be made aware and do their best to minimize tolerance errors.
Although the foundation of a failure analysis is rooted in science, there is also an art to completing one, successfully. The path from “problem discovery” to “problem solution” has many bumps and twists along the way and this article will hopefully help guide you on your journey.
Investigating a Significant Discrepancy in Modern Bulk Cable Injection Test Methods In the 1990s, bulk cable injection (BCI) techniques were still relatively new and controversial. BCI in support of ... Read More...
The models and test procedures used to characterize, determine, and classify the sensitivity of components to ESD.
Like it or not, most electronic designs today are subject to formal EMI testing. So even if you are new to EMI/EMC (electromagnetic interference/compatibility), you need to understand what is involved and how to best prepare for a trip to the EMI test lab.
With the inventions of the transistor in 1948 and the Integrated Circuit in 1958, and the utilization of these major breakthroughs in the development of computers and other electronic devices, industry began to worry about and to design components and end-products that could survive the discharge of electrostatic discharges to chips, printed circuit boards, and final packaged-products.