SiC devices

Researchers Quantify Power-Reducing Semiconductor Factors For First Time

Researchers in Japan have quantified the impacts of multiple electron-scattering mechanisms for the first time, allowing them to determine the resistance of semiconductor devices.

SPICE Models for C2M SiC Power MOSFETs

Cree, Inc. has expanded its design-in support for the C2M™ Series SiC MOSFET power...

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TDK Releases New Output Voltage Power Supplies for Medical/Industrial Devices

ETSI Releases Reports on THz Communications Systems

Practical Engineering: Standards for Electricity Meters and Other Similar Devices

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