Low Voltage Charged Device Model (CDM) Testing at a Crossroads

Most ESD experts consider CDM testing to be the most critical ESD qualification test for modern integrated circuits. ESD control engineers need to know the charged device ESD robustness of all components passing through their manufacturing line. CDM measurements provide that knowledge.

Two Pin HBM Testing: A New Option?

Human Body Model (HBM) is the original ESD test method for semiconductor devices and is still the most widely used ESD test . This article will discuss the old, but now new Two Pin HBM Tester. Not only are the ... Read More...

HBM Pin Combinations

Should I use the pin combinations in Table 2A or Table 2B per Human Body Model (HBM) standard JS-001?
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Open Forum on System Level ESD

Will SEED (system efficient ESD design) truly get us away from the trial and error drudgery of system level ESD design?
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Simulating Small Device CDM Using Spice

In earlier articles in this publication we have discussed the charged device model (CDM) testing of small devices. In the first article we demonstrated that the peak current for small devices does not become vanishingly small.1 The commonly held belief of vanishing current for small devices was shown to be an artifact of measuring the current with the 1 GHz oscilloscope2 specified in the JEDEC CDM standard.6 The second article explained various ways to make CDM testing of small devices more reliable with the use of small surrogate packages, or the use of templates to hold the device during testing.3 In this article we will show how insight can be gained into the CDM testing of small devices using a simple three capacitor circuit model.4, 5