product insights

Passive components can go rogue beyond expected frequencies, resulting in parasitic effects sabotaging EMI suppression. Designers beware, a passive component's non-ideal behavior requires strategic handling.

A differential probe is an active device used to take measurements of certain circuit elements of electronic devices. They are most often used in conjunction with an oscilloscope. Key features and applications of differential probes are summarized in this article.

The 5-Hour Rule, a simple concept many successful people use, is a solution to making the time for honing and developing new skills.

There is one important skill to develop, over and above all others, that makes life much easier, sets you on a path toward success, and increases your status as a true compliance professional.

There are many properties of antennas used to describe their performance. The antenna factor is most useful to those performing electric field radiated emissions measurements.

This blog explains CDM ESD testing using the field-induced (FI) method, which is important for semiconductor manufacturers. It covers building a CDM-FI tester, waveform details and verification, and qualification nuances. 

Making time for even just 30 minutes of focused reading each day will keep you on the path of continuous learning.

Choosing an EMC test lab to work with is one of the most important decisions any electronics design engineer or product developer has to make.

Occasionally, we are asked to help develop shielding effective for near-field low-frequency (LF) magnetic fields, perhaps in a situation where some regulatory agency has imposed limits on LF magnetic field emissions of our product, and we are forced to comply.

Although understanding each capacitor type and behavior is daunting and difficult to memorize, it is prudent that every aspiring engineer and technician involved in design for EMC at least have a rudimentary understanding of what capacitor technologies are available.