product insights

This comprehensive guide explores four critical parameters of RF amplifiers - gain, noise figure, linearity, and efficiency. Understanding these specifications is crucial for engineers designing high-performance amplifiers that deliver clear signal transmission while balancing power consumption and signal integrity in modern communication systems.

Discover the key sources of uncertainty in radiated emissions testing and learn how to calculate measurement uncertainty budgets. Essential insights for EMC professionals seeking more accurate and reliable test results.

Ferrite beads may fail to suppress RF emissions due to misidentified noise sources, high circuit impedance, outdated advice, or incorrect ferrite selection. Careful analysis and appropriate application are crucial for effective EMC compliance.

Don MacArthur explains spectrum analyzers, tools for frequency domain analysis of signals. He covers their functionality, key parameters (center/span, reference level, RBW, VBW), types, and usage. MacArthur emphasizes their importance in electronic measurements and provides tips for preventing damage to the devices. 

Passive components can go rogue beyond expected frequencies, resulting in parasitic effects sabotaging EMI suppression. Designers beware, a passive component's non-ideal behavior requires strategic handling.

A differential probe is an active device used to take measurements of certain circuit elements of electronic devices. They are most often used in conjunction with an oscilloscope. Key features and applications of differential probes are summarized in this article.

The 5-Hour Rule, a simple concept many successful people use, is a solution to making the time for honing and developing new skills.

There is one important skill to develop, over and above all others, that makes life much easier, sets you on a path toward success, and increases your status as a true compliance professional.

There are many properties of antennas used to describe their performance. The antenna factor is most useful to those performing electric field radiated emissions measurements.

This blog explains CDM ESD testing using the field-induced (FI) method, which is important for semiconductor manufacturers. It covers building a CDM-FI tester, waveform details and verification, and qualification nuances.