micron Archives - In Compliance Magazine

Micron and Intel Announce 3D NAND Flash Memory

Micron and Intel announced a new high-density flash memory technology called 3D NAND that can be used for storage inside laptops and mobile consumer devices. In this new architecture, memory cells are stacke... Read More...

Northwest Nazarene University Receives Grant from The Micron Foundation

Northwest Nazarene University in Nampa, Idaho has been awarded a $200,000 grant from the Micron Foundation to assist the University's new bachelor of science in engineering program. The grant will support the e... Read More...

Decoding the Invention of the Radio

Individuals in Engineering and Technology Recognized for STEM Achievements & Community Contributions

U.S. DoE to Provide Nearly $3 Billion for EV Battery Development, Manufacturing

Wirelessly Powering IoT With 5G Network

Polymer Film Can Limit Electromagnetic Interference

Moving Toward ‘Quantified Self’ Life-Logging with the Smartwatch

FCC Levies $6 Million Plus in Fines for Three Pirate Radio Operations

FCC Issues Proposed Rules to Prevent Digital Discrimination

FCC Launches Inquiry Into AI-Based Robocalls/Texts

Utilization of Skin Effect for Intra-plane Z-axis Partitioning in Circuit Boards

ESD Co-Design for High-Speed SerDes in FinFET Technologies

GaN/SiC Transistors for Your Next Design: Fight or Flight?

Local PCB Layout Tweaks for Improved Signal Integrity When Using ESD Protection Devices

Clock Duty Cycle Tuning for Desense Mitigation in Modulation‑Involved Cases

ESD Designers’ Headache with Multiple Automotive Test Requirements, Part I

Troubleshooting EMI Issues Caused by Structural Resonances

Effect of Multi-Burst Lightning Flashes on Surge Protective Devices Using MOVs

GaN/SiC Transistors for Your Next Design: Fight or Flight?

(Re)Discovering the Lost Science of Near-Field Measurements, Part 4

(Re)Discovering the Lost Science of Near-Field Measurements, Part 3

Pre-Compliance EMI Testing

(Re)Discovering the Lost Science of Near-Field Measurements, Part 2

In-Situ Radiated Emission Testing of Large Systems Installations

Revised Standard EN 60695-1-20, Fire Hazard Testing

ANSC C63 Committee on EMC: A 2023 Status Report

An Overview of Aerospace Battery Compliance

The Future of Wi-Fi

EMC Filters Comparison Part II: π and T Filters

NASA Space Shuttle’s Return to Flight: The Untold Electromagnetic Backstory

Continuing Your Professional Education in 2022

A Recipe for Success: How to Grow from EMC Novice to EMC Expert

Capacitors: Theory and Application

Ohm’s Law Also Applies to ESD‑Induced Heat Pulses

RF Tech Tip: BNC Versus Threaded Connectors

Micron and Intel Announce 3D NAND Flash Memory

Northwest Nazarene University Receives Grant from The Micron Foundation

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