Langer EMV

New Near-Field Probe with High Resolution up to 10 GHz

The new SX probe heads' high measurement resolution allows the developer to pinpoint RF...

IC-Scanner ICS 105 with Near Field Micro Probes

The ICS 105 IC scanner from Langer EMV can be used together with the...

Magnetic field source for strong magnetic EFT/burst fields in a tiny space

The BS 06DB-s magnetic field source is used to generate magnetic EFT/burst fields. An...

Automation of EMC tests on ICs

The automated ICT1 IC tester from Langer EMV-Technik is a positioning system for the...

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