Langer EMV

New Near-Field Probe with High Resolution up to 10 GHz

The new SX probe heads' high measurement resolution allows the developer to pinpoint RF...

IC-Scanner ICS 105 with Near Field Micro Probes

The ICS 105 IC scanner from Langer EMV can be used together with the...

Magnetic field source for strong magnetic EFT/burst fields in a tiny space

The BS 06DB-s magnetic field source is used to generate magnetic EFT/burst fields. An...

Automation of EMC tests on ICs

The automated ICT1 IC tester from Langer EMV-Technik is a positioning system for the...

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What's New

Transfer Impedance vs. Shielding Effectiveness

FCC Seeks to Expand Spectrum Available for Satellite Services

FCC Works to Expand Oversight of Foreign Licensees

Basics of Grounding and Bonding for EMC Compliance

FDA Expands Unannounced Inspections of Foreign Manufacturing Facilities

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