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Latch-up Qualification

Often (very) fast transients have been proven to trigger latch-up. This kind of latch-up is called transient induced latch-up, commonly known as “transient latch-up” (TLU).

A Look at the New ANSI/ESDA/JEDEC JS-002 CDM Test Standard

Charged device model (CDM) ESD is considered today to be the primary real world ESD model for representing ESD charging and rapid discharge and is the best representation of what can occur in automated handling equipment used in manufacturing and assembly of integrated circuits (IC) today.
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The ESD Association and JEDEC Collaborate on Standards Development for Harmonized Electrostatic Discharge Test Methods

In September 2006, a small group of ESD control and design stakeholders assembled in a small conference room at the LaPaloma Resort in Tucson, AZ to discuss how the ESD Association (ESDA) and the JEDEC Solid State Technology Association (JEDEC) might harmonize some of their key device (component level) standards documents. Some of the stakeholders involved in those initial discussions (and similar meetings over the next six months) were integrated circuit manufacturers, integrated circuit test manufacturers, original equipment manufacturers, integrated circuit test service providers, and representatives from the ESDA and JEDEC. This first meeting was somewhat extraordinary as these industry stakeholders were able to bring JEDEC and the ESDA to the same table to start working on the harmonization efforts after other previous attempts failed. The key individual sponsoring this meeting was Kay Adams, the ESDA President in 2006-2007.