A Novel Statistical Model for the Electromagnetic Coupling to Electronics inside Enclosures

The goal of this paper is to investigate fundamental mathematical and statistical algorithms for the spatiospectral analysis of electromagnetic coupling in large, complex electronic systems. A novel stochastic Green’s function and a statistical representation formula are proposed, which statistically replicates the multipath wave-chaotic dynamics inside cavity environments. The work achieves a physics-based modeling and simulation capability that predicts the probabilistic behavior of high power radio-frequency induced current and voltages in complex electronic systems.
IEC Releases IEC 61000-4-36 Standard | In Compliance Magazine

IEC Releases IEC 61000-4-36 Standard

The International Electrotechnical Commission has released the IEC 61000-4-36 standards. IEC 61000-4-36 ed1.0 applies to “Electromagnetic compatibility (EMC) - Part 4-36: Testing and measurement techniques ... Read More...