integrated circuit Archives - In Compliance Magazine

Commercial Versus Automotive ESD Integrated Circuit Qualification: Part 2

This is Part 2 of an article describing the difference between the electrostatic discharge (ESD) qualification requirements for automotive and standard commercial integrated circuits.

Commercial Versus Automotive ESD Integrated Circuit Qualification, Part 1

Integrated circuits intended for automotive applications have higher electrostatic discharge (ESD) qualification requirements than those intended for commercial and consumer electronics.

Impact from IC On-Chip Protection Design on EOS

Robust ESD protection does not ensure that IC designs are protected from unintended EOS effects. This article identifies areas of risk in some ESD design methods.

Impact of 3D IC Design on ESD Protection

What is 3D Integration and what is 3D IC? If we rewind three decades, back in the 1980s, there were theoretical studies which suggested that significant reductions in signal delay and power consumption could... Read More...

More Efficient Integrated Circuits Improve Hearing Aids

Researchers at the University of Texas at Arlington are creating better hearing aids by developing a more efficient, low-power integrated circuit (IC). Miniaturization is a very important factor in th... Read More...

World’s Fastest Microchip Operates at 1 Trillion Cycles per Second

A new microchip developed by Northrop Grumman Corp. that operates at one trillion cycles per second, or one terahertz, has set a new Guinness World Record for the fastest microchip ever made. The chip broke... Read More...

EMC Design in the IC Environment with Respect to ESD and Burst

Today's integrated circuits (IC) are very sensitive to disturbances. Fast pulses which were not perceived by slower ICs in the past may now lead to serious disturbances or even total failure. The characteristic... Read More...

An Equivalent Three-Dipole Model for IC Radiated Emissions Based on TEM Cell Measurements

An equivalent dipole model is proposed in this paper to represent the source of radiated electromagnetic emissions from an integrated circuit (IC). The height of an IC is usually much smaller than its length and width, so only three dipole moments are sufficient to characterize an IC in terms of its electromagnetic emissions. The dipole moments can be extracted from three TEM cell measurements. The radiated fields from the IC can then be calculated based on the extracted dipole sources. This IC emission model with three dipole moments is validated using the far-field measurements in a semi anechoic chamber for a test IC. For complex structures, it is desirable that the extracted dipole moments can be incorporated into a commercial full-wave tool as equivalent sources to simulate the radiations from an IC. This is demonstrated using an approach developed in this article.

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