To provide in-depth coverage of ESD testing methods, in this article, we look at another type of ESD testing based on the “Human Body Model” (HBM) method of ESD testing.
Should I use the pin combinations in Table 2A or Table 2B per Human Body Model (HBM) standard JS-001?
How can we provide a quantitative measure of ESD robustness but control the rising test times while preventing major overstress and wear out from thousands of ESD strikes per IC?
Consider a spherical capacitor consisting of two concentric, conducive spheres separated by a dielectric.
Integrated circuits are tested for their robustness to electrostatic discharge (ESD) using the Human Body Model (HBM) and Charged Device Model (CDM) test methods. Circuits which pass 1000 V HBM or 250 to 500 V CDM can be handled with high yield in manufacturing facilities using basic ESD control procedures. [1, 2] HBM is the oldest, best known and most widely used ESD test method, but most ESD factory control experts contend that the vast majority of ESD failures in modern manufacturing lines are better represented by the CDM test method. The CDM test method is intended to reproduce what happens when an integrated circuit becomes charged during handling, and then discharges to a grounded surface.