hot topics in esd

Often (very) fast transients have been proven to trigger latch-up. This kind of latch-up is called transient induced latch-up, commonly known as “transient latch-up” (TLU).

ESD process control in factories where ESD-sensitive parts are being handled is the foundation for the manufacturing of high quality electronic products.

Circuit design reliability verification in Integrated Circuit (IC) design is extremely challenging.

Charged Device Model testing faces a reliability crisis as qualification levels drop below 250V. Legacy air spark methods become increasingly variable at lower voltages, while emerging relay-based alternatives offer consistent results without sacrificing correlation—a critical evolution for next-generation semiconductor qualification.