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hot topics in esd

Latch-up Qualification

Often (very) fast transients have been proven to trigger latch-up. This kind of latch-up is called transient induced latch-up, commonly known as “transient latch-up” (TLU).

Beyond ANSI/ESD S20.20: High Reliability ESD Control Processes and Lower ESD Sensitivities

ESD process control in factories where ESD-sensitive parts are being handled is the foundation for the manufacturing of high quality electronic products.

Latch-up Electronic Design Automation Checks

Circuit design reliability verification in Integrated Circuit (IC) design is extremely challenging.

Next Generation Charged Device Model ESD Testing

The charged device model describes the electrostatic discharge (ESD) event that occurs when an integrated circuit (IC) is rapidly charged or discharged through a single pin to a metallic surface.

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