H-field Probe

Case Study: Point of Sale Terminal ESD

Field failures traced to ESD-induced USB hub damage in deployed POS terminals. Through systematic H-field probe analysis, we identified poor connector-to-chassis bonding as the root cause—a preventable design oversight with expensive retrofit implications.

Digital Sponsors

Become a Sponsor

What's New

The Backbone of EMC Testing: RF Amplifiers and Their Role in Ensuring Compliance

Astronomers Discover a Lemon-Shaped “Exoplanet”

EU Commission Proposes to Simplify Med Tech Regulations

FCC Releases Annual Robocall Report

Report Says Insufficient FDA Staffing Limits Oversight of Med Device Recalls

- From Our Sponsors -