gunter langer

The immunity to ESD of present-day electronic components and devices has further decreased due to the high sensitivity of ICs.

Electronic devices can be exposed to electrostatic discharge (ESD). The discharge process generates rapid electric and magnetic processes that can impair the function of the electronic devices. Devices are tested for their immunity to ESD using special ESD generators and test setups (EN 61004-2).

This article deals with improving EMC measuring methods that are used during the development of automobiles in the field of interference emissions. Development-stage investigations are normally performed with measuring systems that have actually been conceived for vehicle component tests. EMC measuring methods that are tailored to the development stage, however, are much better suited for this task since they help save time and costs. One such measuring method is presented here as a practical example.