TLP ideas are helpful in understanding CDE, but it is an imperfect analogy
Charged device model (CDM) ESD is considered today to be the primary real world ESD model for representing ESD charging and rapid discharge and is the best representation of what can occur in automated handling equipment used in manufacturing and assembly of integrated circuits (IC) today.
The IEW will include invited seminars, technical sessions, special interest groups (SIGs), discussion groups, and invited speakers. The IEW especially invites submission of late-breaking exciting new research to stimulate discussion and interaction around new ideas, encouraging new research topics. To maintain the unique IEW experience and provide ample opportunity for informal discussions, the 2016 IEW workshop presentation format for Technical sessions will begin with each author presenting a brief summary to highlight key findings, followed by an interactive poster-based discussion session among authors and attendees. The IEW is closely aligned with the EOS/ESD Symposium for collaborative conference activities.
The EOS/ESD Association, the global leader in ESD Control Standards announced the launch of its TR53 Technician Certification Program. The ESDA established the TR53 Technician Certification Program, which ... Read More...
Standards are increasingly important in our modern global economy – supply chains can be dizzyingly complex, and implementing the economic theory of comparative advantage has been more and more possible as the relative cost of transportation has declined over the years. Since the 1890s, the United States has been the world’s top manufacturing country. The world continues to change. Recently it was reported that China surpassed Japan as the second largest economy, and it is estimated that China will soon surpass the United States.