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The Transistor: An Indispensable ESD Protection Device – Part 1

Nowadays in the semiconductors industry, the bipolar transistor is massively used for various functions in modern integrated circuits (ICs) products.

High Voltage ESD Protection for Automotive Ethernet Applications

Ethernet solutions have been popular in industrial and computing applications for several decades but were not widely adopted in the automotive area. Automotive ethernet enables fast and robust data communication, with high flexibility in bus topologies for multiple electronic control units (ECUs).

The Many Aspects of Semiconductor Reliability with Impact on ESD Design

Reliability issues need to be continuously addressed during technology development as technologies further advance into novel transistor structures such as FinFETs and Multi-gate devices.

Commercial Versus Automotive ESD Integrated Circuit Qualification: Part 2

This is Part 2 of an article describing the difference between the electrostatic discharge (ESD) qualification requirements for automotive and standard commercial integrated circuits.

Commercial Versus Automotive ESD Integrated Circuit Qualification, Part 1

Integrated circuits intended for automotive applications have higher electrostatic discharge (ESD) qualification requirements than those intended for commercial and consumer electronics.
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Using an AM Radio as an Effective Troubleshooting Tool

An AM radio can be useful for finding both radiated emissions and ESD events. Understanding how radio works is essential for engineers to use this low-cost technology to troubleshoot complex EMI issues.

ESD Compliance in a Server Room

A careful review of empirical research, multiple ESD standards, and return on investment provides a strong case for evaluating the installation of ESD flooring in server rooms and data centers.

Industry Council’s Latch‑up Survey

This article provides a high-level overview of the Industry Council paper “Survey on Latch‑up Testing Practices and Recommendations for Improvements,” which describes the full analysis of the collected responses and lays a path for potential adaptations needed to accommodate its use in future technologies and applications.

Challenges of Designing System-Level ESD Protection at the IC-Level

There is often confusion about the interaction between IC-level component ESD protection and the appropriately required system-level ESD protection strategy.

Latch-up Electronic Design Automation Checks

This article introduces typical latch-up verification techniques to detect and prevent latch-up. These techniques rely on electronic design automation (EDA) tools to deliver the coverage necessary to identify and eliminate latch-up risks. 
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