ESD Issues for Flat Panel Displays

As innovation comes from many sources, it is difficult to predict or accurately forecast future display technology development. Curved and flexible displays were introduced as the most innovative display technology achievement along with OLEDs in the last 10 years.

Two Pin HBM Testing: A New Option?

Human Body Model (HBM) is the original ESD test method for semiconductor devices and is still the most widely used ESD test . This article will discuss the old, but now new Two Pin HBM Tester. Not only are the ... Read More...

System-Level Simulation Solutions for EOS and ESD

The electronic industry has embraced simulation to address several complex design challenges, but reliability is still mostly dealt with best design practices and tested with prototypes. In this article, we present how modeling and simulation approaches can help designers perform virtual prototyping and uncover reliability issues especially EOS/ESD before going for physical prototypes.

Device Failure from the Initial Current Step of a CDM Discharge

CDM discharges exhibit a fast initial current step when the stray capacitance of the pogo pin is charged. It is demonstrated that the high slew rate can damage sensitive gate oxides. The miscorrelation of CDM and CC-TLP methodologies is addressed by applying pulses with 20 ps rise time.

Why You Should Pay Attention to Cable Discharge Events (CDE)

Cable discharge events occur more frequently than we think, but they often go unrecognized or undiagnosed for root causes, resulting in unnecessary device failures. This article discusses the origins of three types of cable discharge events.