esd

Often (very) fast transients have been proven to trigger latch-up. This kind of latch-up is called transient induced latch-up, commonly known as “transient latch-up” (TLU).

ESD qualification requirements for systems rely heavily on discharge models such as IEC61000-4-2.

How is automated handling equipment treated under an S20.20 compliant ESD program?

Circuit design reliability verification in Integrated Circuit (IC) design is extremely challenging.

How can we provide a quantitative measure of ESD robustness but control the rising test times while preventing major overstress and wear out from thousands of ESD strikes per IC?

Learn about the design of a stand-alone (off- chip) protection device which meets all requirements.

Charged device model (CDM) ESD is considered today to be the primary real world ESD model for representing ESD charging and rapid discharge and is the best representation of what can occur in automated handling equipment used in manufacturing and assembly of integrated circuits (IC) today.

Each component in an ESD protected area (EPA) plays a vital part in the fight against electrostatic discharge (ESD). If just one component is not performing correctly, you could harm your ESD sensitive devices potentially costing your company a lot of money.

Transmission Line Pulse testing is the default method for characterizing the behavior of devices under ESD circumstances.

Consider a spherical capacitor consisting of two concentric, conducive spheres separated by a dielectric.