Electrostatic Discharge (ESD) protection of Integrated Circuits (ICs) requires seamless discharge paths and voltage clamping along the course of the discharge, between any pins combinations on the IC.
Absolute Maximum Ratings (AMR) are typically listed on semiconductor product datasheets, warning that overstress results in physical damage, jeopardizing reliability.
TLP ideas are helpful in understanding CDE, but it is an imperfect analogy
This article defines ionization qualification and periodic verification test procedures for ionizers which are not addressed in STM3.1 or SP3.3, including air-assist bar ionizers, soft x-ray ionizers, an alternative method of room ionization, and non-airflow alpha ionizers.
Updates to Past CDM Open Forum Questions
Section 7.3 in ANSI/ESD S20.20–2014 includes a requirement for a product qualification plan.
The Industry 4.0 IoT platform automatically becomes a reliable and dependable venue for compliance verification, eliminating the traditional way of tedious predefined period manual checks.
How is automated handling equipment treated under an S20.20 compliant ESD program?
Circuit design reliability verification in Integrated Circuit (IC) design is extremely challenging.
Transmission Line Pulse Testing: The Indispensable Tool for ESD Characterization of Devices, Circuits and Systems
Transmission Line Pulse testing is the default method for characterizing the behavior of devices under ESD circumstances.