The Dilemma Between Customers and Suppliers on EOS Failures

During the last four decades, damage to devices from electrical overstress (EOS) has confounded both IC suppliers and customers. The Industry Council on ESD Target Levels investigated numerous EOS root causes and established a white paper on the subject, JEP174 [1].

Rethinking Electrical Overstress

Electrical overstress (EOS) accounts for most of the electrical failures of devices that occur in factories and in the field. One important electrical stress, electrostatic discharge (ESD), has received much at... Read More...