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Banana Skins – June 2024 (#452-453)

We are proud to carry on the tradition of sharing Banana Skins for the purpose of promoting education for EMI/EMC engineers.

Using RF Monitoring Probes to Troubleshoot Transient Failures

In large systems, such as big cabinets housing numerous electronic components, employing the near-field probe method can be time-consuming and, depending on the voltage level, potentially unsafe (for instance, when dealing with high-voltage circuits requiring isolation). In such scenarios, an alternative approach is necessary.

Saelig Introduces New Features in Ramsey RF Test Enclosures

Patented RF-free Ramsey housings from Saelig now provide improved, highly-isolated bench-top environments for performing pre-compliance and evidentiary investigations of electronic devices.

Using a Near-Field Probe to Troubleshoot Transient Failures

Solving EMI problems isn’t only about ensuring that a product can meet EMC regulations and standards (although it’s a significant part of the job). Another crucial reason for addressing EMI issues is to enhance product reliability, especially when a product operates in public or industrial areas where there are many different types of noise sources.

Banana Skins – February 2024 (#437-444)

A manufacturer of electrical test equipment took an order worth several million dollars for new product to be used worldwide to help service the vehicles manufactured by a major multinational.
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Setting Up a Benchtop Conducted Emission Test

Conducted emission tests can provide reasonably accurate results and also serve as a reliable indicator of radiated emissions, as some of these emissions propagate through cable wiring.

(Re)Discovering the Lost Science of Near-Field Measurements, Part 4

This is the fourth and final article in our series commemorating 70 years since the advent of modern EMC testing.

Banana Skins – October 2023 (#433-436)

The paper machine process requires precise control of the paper sheet tension as it progresses through the machine.

(Re)Discovering the Lost Science of Near-Field Measurements, Part 3

This article is the third in a series commemorating 70 years since the advent of modern EMI testing. But this last article is itself divided into multiple parts, due to the topic’s complexity. Unlike the previous two articles, which mainly tracked evolution and explained issues, this series of installments argues that we started off correctly seventy years ago, but then took the wrong fork in the road in 1967.

Pre-Compliance EMI Testing

Pre-compliance testing saves time and costs by detecting potential problems early in the design process. The use of appropriate tools and techniques improves the chances of passing the full compliance test on the first try.
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