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Product Insights: Non-Ideal Behavior of Passive Components

Passive components can go rogue beyond expected frequencies, resulting in parasitic effects sabotaging EMI suppression. Designers beware, a passive component's non-ideal behavior requires strategic handling.

EMC Archaeology: A Tale of Two Meters

Of Decibels and Centibels, and EMC Engineers in a Row The ubiquitous 41” rod antenna...

Banana Skins – June 2024 (#452-453)

We are proud to carry on the tradition of sharing Banana Skins for the purpose of promoting education for EMI/EMC engineers.

Using RF Monitoring Probes to Troubleshoot Transient Failures

In large systems, such as big cabinets housing numerous electronic components, employing the near-field probe method can be time-consuming and, depending on the voltage level, potentially unsafe (for instance, when dealing with high-voltage circuits requiring isolation). In such scenarios, an alternative approach is necessary.

Saelig Introduces New Features in Ramsey RF Test Enclosures

Patented RF-free Ramsey housings from Saelig now provide improved, highly-isolated bench-top environments for performing pre-compliance and evidentiary investigations of electronic devices.
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Using a Near-Field Probe to Troubleshoot Transient Failures

Solving EMI problems isn’t only about ensuring that a product can meet EMC regulations and standards (although it’s a significant part of the job). Another crucial reason for addressing EMI issues is to enhance product reliability, especially when a product operates in public or industrial areas where there are many different types of noise sources.

Banana Skins – February 2024 (#437-444)

A manufacturer of electrical test equipment took an order worth several million dollars for new product to be used worldwide to help service the vehicles manufactured by a major multinational.

Setting Up a Benchtop Conducted Emission Test

Conducted emission tests can provide reasonably accurate results and also serve as a reliable indicator of radiated emissions, as some of these emissions propagate through cable wiring.

(Re)Discovering the Lost Science of Near-Field Measurements, Part 4

This is the fourth and final article in our series commemorating 70 years since the advent of modern EMC testing.

Banana Skins – October 2023 (#433-436)

The paper machine process requires precise control of the paper sheet tension as it progresses through the machine.
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