emc

This article presents the derivation of the radiated far fields from a Hertzian dipole antenna above the ground plane using image theory.

The Banana Skin columns were compiled by Keith Armstrong, of Cherry Clough Consultants Ltd, from items he found in various publications, and anecdotes and links sent in by the many fans of the column.

Patrick Andre looks at the history and development of DO-160, “Environmental Conditions and Test Procedures for Airborne Equipment.”

Spectrum analyzers are usually the tool of choice for troubleshooting CE or RE. In recent years, the cost of a basic analyzer has dropped markedly. However, the more expensive lab-quality analyzers will have advanced measurement features that may be worth considering.

For a company embarking on EMC testing for either component or vehicle-level testing of their EV products, it is necessary first to have a good understanding of the EMC regulatory situation.

This column describes the operation of an ideal difference amplifier. It is shown that an ideal difference amplifier (with no resistance mismatches) eliminates the common mode portion of the input voltage and amplifies only the differential mode portion of the input voltage.

A manufacturer of electrical test equipment took an order worth several million dollars for new product to be used worldwide to help service the vehicles manufactured by a major multinational.

This engaging 200-page handbook compiles a lifetime of learning and key lessons on various aspects of Electromagnetic Compatibility, written with wit and charm.

Electromagnetic compatibility (EMC) is the ability of electronic equipment to function properly without interference from noise sources and without causing disturbances to other electronic equipment. This article will help the reader understand the modes of electrical noise propagation, how fields interact, and the methods of testing for EMC, helping to provide the basis for designing low-emissions, low-susceptibility electronic equipment.

This article describes a laboratory experiment that shows the impact of the decoupling capacitors and a PCB trace length on the signal integrity in a CMOS inverter circuit.