EMC troubleshooting

EMC Bench Notes: Interpreting Emissions Using a Near-Field Probe

Not all EMC emissions look alike — and knowing the difference can save your compliance test. Kenneth Wyatt breaks down how to use near-field probes to identify and interpret broadband versus narrowband emission profiles, so you can trace noise back to its source before it becomes a costly failure.

EMC Bench Notes: How to Use Spectrum Analyzers for EMC

Spectrum analyzers are the go-to tool for diagnosing conducted and radiated emissions — but knowing how to configure them makes all the difference. Kenneth Wyatt walks through key settings, trace strategies, and practical tips for getting reliable results on the bench.

Mastering Radiated Emissions Testing: Tips for Success in EMC Compliance

Radiated emissions testing is a critical—and complex—step in EMC compliance. This practical guide walks engineers through preparation, equipment setup, and troubleshooting strategies to help identify and resolve emissions issues before they become costly certification failures.

Troubleshooting EFT, Part 1

Electrically fast transient (EFT/B) testing simulates switching and motor-induced transients that can disrupt electronic systems. This article explains the fundamentals of EFT immunity, outlines practical benchtop testing alternatives, and provides step-by-step guidance for identifying and resolving EFT susceptibility before formal compliance testing.

Using Reciprocity Theorem to Troubleshoot Immunity Issues

When traditional EMC troubleshooting tools fall short, the reciprocity theorem can reveal hidden immunity problems. This real‑world case study shows how unexpected RF sources—like walkie‑talkies—can expose susceptibility paths, helping engineers diagnose failures and strengthen designs with simple, effective fixes.
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Hidden Start-up Events

Start‑up transients can hide major EMI and reliability problems. By capturing inrush current spikes and high‑frequency events with high‑bandwidth scopes and probes, engineers can uncover failures, resets, and random behavior caused by fast di/dt during power‑up—and design effective fixes.

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