emc concepts explained

This s-parameters tutorial consists of two parts: Part I discusses the fundamental background needed to understand the concept of s-parameters; Part II explains the s-parameters use in EMC measurements and testing

This article examines the spread-spectrum frequency dithering technique to reduce the EMI noise from a SMPS.

This column explores the conducted immunity test known as a Bulk Current Injection (BCI) test, according to ISO 11452-4 specification.

This article discusses a practical approach to designing an input filter to the switch-mode power supply (SMPS).

We compare the shielding effectiveness of various solid metallic shields by direct H-field measurements in the near field of the source.

In this article we investigate the frequency behavior of a ceramic capacitor.

This article discusses the crosstalk reduction between PCB traces by utilizing a guard trace between the traces and investigating the effect of the guard trace grounding.

This article is devoted to the radiated emissions measurements. These measurements can be performed either at the Open Area Test Site (OATS) or in an Absorber-Lined Shielded Enclosure (ALSE).

The article discusses the behavior of voltage and current waves on a transmission line with different types of loads and explains how to measure the VSWR of an antenna.

This article focuses on the current probes used in EMC measurements and testing.