EMC Bench Notes

A simple antenna positioned right on your bench can reveal radiated emissions in real time. Learn how to separate product harmonics from ambient RF noise, track down capacitive and inductive coupling paths, and use copper tape and foil to hunt down leaky seams and apertures.

Not all EMC emissions look alike — and knowing the difference can save your compliance test. Kenneth Wyatt breaks down how to use near-field probes to identify and interpret broadband versus narrowband emission profiles, so you can trace noise back to its source before it becomes a costly failure.

An Arduino-based board with no solid ground return plane makes the perfect "what not to do" test case. Near-field probe measurements, spectrum analyzer captures, and real emissions data reveal why two-layer designs can be EMC trouble — and what it takes to fix them.

Spectrum analyzers are the go-to tool for diagnosing conducted and radiated emissions — but knowing how to configure them makes all the difference. Kenneth Wyatt walks through key settings, trace strategies, and practical tips for getting reliable results on the bench.

Learn the essentials of EMC troubleshooting for product designers with this introductory column from Kenneth Wyatt. It explains why EMC failures derail product launches, highlights core design challenges, and offers foundational resources to help engineers start diagnosing emissions and immunity issues directly on the bench.

Electrically fast transient (EFT/B) testing simulates switching and motor-induced transients that can disrupt electronic systems. This article explains the fundamentals of EFT immunity, outlines practical benchtop testing alternatives, and provides step-by-step guidance for identifying and resolving EFT susceptibility before formal compliance testing.

Harmonic comb generators are essential EMC lab tools that produce harmonically-related signals for chamber verification and troubleshooting. Learn why every test lab needs one, how to build a simple DIY version for under $50, and discover the best commercial options with unique features. From measuring cable resonances to portable chamber validation, these versatile devices belong in every EMC engineer's toolkit.

Field failures traced to ESD-induced USB hub damage in deployed POS terminals. Through systematic H-field probe analysis, we identified poor connector-to-chassis bonding as the root cause—a preventable design oversight with expensive retrofit implications.

ESD failures are increasing as products shrink and use lower voltages with smaller noise margins. Learn how to trace ESD current paths using H-field probes and oscilloscopes to quickly identify where discharge energy flows, enabling targeted fixes like bonding and shielding to solve immunity problems efficiently.

Three real-world case studies show how RF power amplifiers and creative benchtop setups solve complex radiated immunity failures in hours instead of weeks. From military-grade testing to runaway medical motors, discover techniques that save time and money while identifying root causes traditional methods miss.