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Designing for EMP Resilience

This article provides an overview of high-altitude electromagnetic pulses and the damaging effects they pose to sensitive electronic circuitry, equipment and systems that support a wide range of critical applications, along with common EMP protection approaches and current testing methods used to evaluate the resilience of equipment and systems exposed to an EMP attack.

Thermal Runaway Energy Release as a Function of the State of Charge

Designing safe products powered by lithium-ion batteries requires an understanding of how the battery pack will behave while undergoing thermal runaway. In this work, fractional thermal runaway calorimetry is used to estimate the energy release from cells at different states of charge when undergoing a thermal runaway.

Keysight Introduces Next-Generation Radio Frequency Circuit Simulator for RFIC Chip Designers

Keysight Technologies, Inc. introduces RFPro Circuit, a next-generation radio frequency (RF) simulation tool targeting the complex, multi-physics requirements of today's RF integrated circuit (RFIC) designers.

UMass Research Team Expands Our Understanding of Fourier’s Law

In today’s ever-changing world, nothing ever stays the same! That trend reportedly extends even to the tenets of Fourier’s Law, a 200-year-old science-based principle that defines how heat diffuses through solid materials.

ESD Designers’ Headache with Multiple Automotive Test Requirements, Part 2

The trend of progressively migrating both ESD and EMC immunity from the system/board to the component level is creating unprecedented challenges for the component ESD designer.
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ESD Co-Design for High-Speed SerDes in FinFET Technologies

The narrow ESD design window in current FinFET technologies creates a special challenge for the robust ESD design of high-speed interfaces. Smart circuit-ESD co-design can help achieve the required ESD robustness without deteriorating functional performance.

Understanding Embedded On-Chip ESD Detection, Part 1

ESD “event detectors” have been used for years in factory environments to identify and remediate ESD discharges during manufacturing. Now design engineers are embedding system-level and on-chip ESD detection technologies into their systems to analyze and recover from both factory and field ESD events.

GaN/SiC Transistors for Your Next Design: Fight or Flight?

This article offers some useful insights and guidelines on how to effectively design and test systems using wide band gap devices to optimize product performance and achieve EMC compliance.

Local PCB Layout Tweaks for Improved Signal Integrity When Using ESD Protection Devices

This article describes a practical way to improve signal integrity of typical interfaces on the PCB when using external ESD devices.

Troubleshooting EMI Issues Caused by Structural Resonances

Most EMI issues are caused by a resonance that is excited somewhere in the system. It may be a resonance of a cable acting as an antenna or a heatsink energized by the power electronics switches bolted to it, becoming a good radiator. In this article, we look at the indicators that signal the presence of structural resonances and provide techniques for fixing the EMI issues. Practical case studies are presented to demonstrate the techniques.
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