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Tagged Charvaka Duvvur

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Charvaka Duvvur

The Many Aspects of Semiconductor Reliability with Impact on ESD Design

Reliability issues need to be continuously addressed during technology development as technologies further advance into novel transistor structures such as FinFETs and Multi-gate devices.

Evolution of Charged Device Model ESD Target Requirements

Historical Background  CDM is an important model for ESD qualification. The well-known CDM refers to the discharge of an IC package to a grounded surface, whether from automatic handlers in a production area o... Read More...

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