Charvaka Duvvur

The Many Aspects of Semiconductor Reliability with Impact on ESD Design

Reliability issues need to be continuously addressed during technology development as technologies further advance into novel transistor structures such as FinFETs and Multi-gate devices.

Evolution of Charged Device Model ESD Target Requirements

Historical Background CDM is an important model for ESD qualification. The well-known CDM refers to...

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Lightning, Part 1

FCC Issues Annual PIRATE Act Report

FCC Expected to Exempt Amateur Radio Operators from Foreign Adversary Reporting Requirements

Designing for ESD Immunity: Insights from Compliance Testing

FCC Approves Expanded Unlicensed Use of 6GHz Band

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