Shimadzu Scientific Instruments announced the release of its new series of high-end energy dispersive X-ray fluorescence spectrometers. Incorporating a new high-performance semiconductor detector, the EDX-7000/8000 spectrometers offer excellent sensitivity, resolution, and throughput for an array of applications, from general screening analysis to advanced materials research.
The EDX-7000/8000 systems’ new state-of-the-art semiconductor detector (SDD) offers a high fluorescent X-ray count per unit time. This enables precise, high-resolution analysis while increasing throughput by as much as a factor of 10 compared to the company’s industry-leading predecessor unit. This speed allows researchers and labs to increase their productivity without sacrificing accuracy. In addition, since it is electronically cooled, the SDD does not require liquid nitrogen. This reduces operating costs and maintenance requirements. When combined with optimized optics and five primary filters, the EDX-7000/8000 spectrometers achieve unprecedented levels of sensitivity and energy resolution.
The EDX-7000 provides a measurement range of 11Na to 92U, while the EDX-8000 has a range of 6C to 92U. Both systems are equipped with five primary filters that enable highly sensitive analysis of trace elements and a sample observation camera for precise sample positioning. A large sample chamber accommodates virtually any sample type small or large, including thin films, powders, slurries, emulsions and liquids.
Shimadzu’s EDX-7000/8000 spectrometers use PCEDX Navi operating software. Featuring a simple but refined user interface, the software offers intuitive operation, easy instrument initialization and startup, and a variety of report formats, which makes the systems easy to use for operators of all skill levels, from beginner to expert. PCEDX-Pro software is also available to support more advanced research functions.
Optional equipment includes a vacuum measurement unit and helium purge unit for highly sensitive measurement of light elements and a 12-sample turret for automated continuous measurements. In addition, a screening analysis kit allows users to start RoHS, halogen, or antimony screening with ease.
For more information about the EDX-7000/8000 energy dispersive X-ray fluorescence spectrometers, visit http://www.ssi.shimadzu.com/products/product.cfm?product=edx7000_8000.
