Semiconductor Wafer Measurement for Increased Productivity

This white paper reviews best practices, the consequences of failing to inspect semiconductor wafers, and the benefits of using semi-automated, fully-automated, and manual systems for wafer metrology and inspection.

• Why does disc geometry matter in wafer production?
• Impacts of failing to inspect semiconductor wafers
• Benefits and applications of manual, semi-automated, and fully automated systems for semiconductor wafer manufacturing

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