Semiconductor Wafer Measurement for Increased Productivity

This white paper describes how manufacturers leverage capacitance-based systems for semiconductor wafers.

This white paper reviews best practices, the consequences of failing to inspect semiconductor wafers, and the benefits of using semi-automated, fully-automated, and manual systems for wafer metrology and inspection.

  • Why does disc geometry matter in wafer production?
  • Impacts of failing to inspect semiconductor wafers
  • Benefits and applications of manual, semi-automated, and fully automated systems for semiconductor wafer manufacturing

This offer is sponsored by

Download the white paper to learn more.

Leave a Reply

Your email address will not be published.