Rohde & Schwarz invites visitors at the IEEE MTT-S International Microwave Symposium (IMS) 2025 to witness the debut of a game-changing analyzer that will overcome the limitations of today’s measurement methods. With a novel architecture that combines multiple input ports with cross-correlation techniques, the analyzer allows for completely new measurement scenarios in RF system testing. Rohde & Schwarz presents its signal analysis revolution with wider modulation bandwidths and higher modulation orders to conquer the requirements for ever-increasing data rates.
In addition, Rohde & Schwarz will showcase updates for its R&S FSWP, the industry reference for phase noise testing. Besides a frequency range extension, the phase noise analyzer’s capabilities have been expanded for additive and residual phase noise measurements and the support of external high-end sources as local oscillators.
Another highlight at the company’s booth is the new R&S ZNB3000 vector network analyzer, which is optimized for high-volume production and short ramp-up times thanks to industry-leading measurement speed and reliability. Its scalable design allows for rapid upscaling and easy adaptation to application specific requirements.
Rohde & Schwarz continues to expand its solution partner relationships. At IMS 2025, the company lets exhibition attendees experience RF design workflows in a fun way with the IMS workflow passport challenge. It involves stops at multiple industry partners and a chance to win prizes.
Visitors can find Rohde & Schwarz in booth #1443 at the Moscone Center in San Francisco, CA, from June 17 to 19, 2025. Rohde & Schwarz experts will be participating in the IMS 2025 Micro App sessions and workshops, open to all IMS show attendees. For show updates from Rohde & Schwarz, follow Rohde & Schwarz solutions for Electronic Design on LinkedIn.
