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Registration is now underway for the 8th Annual International Electrostatic Workshop (IEW)

The EOS/ESD Association will host the 8th Annual International Electrostatic Workshop (IEW) from May 19-22, 2014 at the Grand Hôtel de Paris, in Villard de Lans, France.

The IEW Technical Program consists of ESD poster presentations, special interest/discussion groups, seminars, and invited talks. Special focus topics for the 2014 IEW include “Automotive EOS/ESD” and “Foundry Support and CAD for ESD”. A number of other key topics (such as technology innovation in the ESD field, System-Level ESD events, EOS, ESD test methods) will also be featured and discussed.

The Grand Hôtel de Paris is in the breathtaking setting of the French Alps. This great event is characterized by a friendly, interactive atmosphere and provides a unique environment for envisioning, developing, and sharing ESD design and test technology for present and future semiconductor applications.

- Partner Content -

Shielding Effectiveness Test Guide

Just as interference testing requires RF enclosures, isolation systems in turn need their own testing. This document reviews some of the issues and considerations in testing RF enclosures.

Visit www.esda.org/iew.htm for additional details about the program and to register for the event.

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