Kathleen Muhonen is an ESD engineer at Qorvo in Greensboro, NC. She is involved in ESD on-chip protection for RF and Millimeter wave applications. She is also heavily involved in system level testing and helped standardize IED testing of RF components. Kathleen has served on multiple ESD Association device testing standards committees, and has chaired the TLP and HMM workgroups. She has also presented a number of papers at the EOS/ESD Annual Symposium over the last decade. Kathleen holds a BSEE degree from Michigan Technological University, an MSEE from Syracuse University, and Ph.D.EE from Penn State University.
