What's New

This paper describes how to remove the measurement artifacts caused by discontinuities in high frequency S-parameter data caused by the test connectors on the Printed Circuit Boards (PCBs) and cables. The frequency domain S-parameters are converted to the time domain to get the impulse response. Time domain gating is then used on this impulse response to remove reflections due to end connectors and/or other discontinuities. The gated impulse response is then transformed back to the frequency domain. The final result is a much improved S-parameter data set with unwanted resonance removed, allowing the PCB trace or cable loss to be determined.

This is the first in a series of articles that, instead of focusing on technical aspects of EMC design, engineering, testing, and standards which all of us enjoy reading, I am taking a different approach as a contributing editor to examine in a controversial manner who we are and where our career may possibly take us in the future.