A team of international researchers are developing a new technique using the Canadian Light Source (CLS) synchrotron that could display the inner-workings of electronic devices. The development of a new class of electronic materials, transition-metal oxides, creates a unique phenomenon unlike conventional semiconducting films currently used in electronic devices.
The new technique uses resonant X-ray reflectivity that allows researchers to view the films at the atomic level, providing a depth-resolved image of the structure. This is the first time the building blocks of these new transition-metal oxides can be seen in a non-destructive method. Researchers will be able to gain a better understanding of how devices operate by being able to see how the interfaces of this material work and can lead to improved electronic devices. This new technology would be suitable for a wide variety of advanced nanoelectronics and devices.
Read more about the technique developed to look inside electronic devices.
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