New engaging sessions at the 39th Annual EOS/ESD Symposium, Tutorials, and Exhibits.
Symposium registration includes a NEW manufacturing track with 6 short tutorials, 5 hands-on sessions, 2 invited talks, and 2 discussion groups.
Register now for the 39th Annual EOS/ESD Symposium to be held September 10-15, 2017, at the Westin La Paloma Tucson, AZ, USA. Benchmark your company’s operation against the practices of other companies. Solve business challenges in controlling ESD by networking with other ESD professionals and industry experts to learn best practices and technology advancements for ESD Control.
The EOS/ESD Symposium offers the unique opportunity for an overview of the latest progress in electrical overstress and electrostatic discharge protection technology. This special event combines advanced tutorials, technical presentations, exhibits of ESD control products and services, workshops, authors’ corners and an exhibitors “Showcase” of ESD-mitigation products giving a maximum value-added experience to the attendees. Highlights of the Symposium include:
- Technical Sessions with 51 engaging ESD presentations plus a NEW engaging track that includes; 6 short tutorials, 5 hands-on sessions, 2 invited talks, and 2 discussion group sessions!
- Two Year-in-Review sessions on “The Birth and the Life of an ESDA Standard” and on “Transmission Line Pulse Testing for ESD”.
- 35 Tutorials to keep you current, organized in 4 dedicated tracks: ESD device design, IC ESD design, system ESD design and ESD control. New courses include:
- Control of Charged Board Event (CBE)
- Basics of EMI and EOS in Manufacturing Environment and First Mitigation
- Integrated ESD Device and Board Level Design
- ESD Challenges in Advanced FinFET and Gate-All-Around Nanowire CMOS Technologies
- Design for EOS Reliability
- Electrical Fields and Particles – Practical Considerations for the Factory
- Workshops for stimulating discussions on ESD Design, Factory Control, and Testing.
- A.1 Friendly ESD Integration of 3rd Party IP in SoCs?
- One Year after The Industry Council White Paper 4 Release: What is the Impact of this Publication on the Understanding of EOS?
- Beyond ANSI/ESD S20.20: High Reliability ESD Control Processes and Lower ESD Sensitivities
- HBM and CDM Standards – Recent Advances and Application to Devices
- EDA for Latch-up: Which are the Most Suitable Approaches?
- ESD and EMI Codesign – a Topic Both for IC and PCB Designers
- Machine Model and the Impact on Manufacturing
Visit https://www.esda.org/events/symposia/ to register or for additional details about this year’s event.
