The new R&S RT-ZP1X passive 1:1 probe broadens the application range of its R&S RTO and R&S RTE series oscilloscopes. Both the probe and the oscilloscopes’ frontend are extremely low noise, making this combination ideal for measuring the smallest of signals down to 1mV/div, e.g. for power integrity measurements on integrated circuits and components.
With an acquisition rate of up to 1 million waveforms per second, users may quickly obtain meaningful measurement results, complete with histogram and all signal components. In the zoom view in 16 bit high definition (HD) mode, even the smallest of signal details can be analyzed and triggered.
The probe is also suitable for the R&S RTM (up to 1 GHz) and R&S HMO (70 MHz to 500 MHz) oscilloscopes.
