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New Edition of IEC 61000-4-30 for EMC Test & Measurement Released

The International Electrotechnical Commission has released a new edition of IEC 61000-4-30 ed3.0.

IEC 61000-4-30:2015 ed 3.0 applies to “Electromagnetic compatibility (EMC) – Part 4-30: Testing and measurement techniques – Power quality measurement methods”. The new edition is available for purchase on the IEC’s website.

Description*

- Partner Content -

A Dash of Maxwell’s: A Maxwell’s Equations Primer – Part Two

Maxwell’s Equations are eloquently simple yet excruciatingly complex.

IEC 61000-4-30:2015 is available as IEC Standards+ 61000-4-30:2015 which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 61000-4-30:2015 defines the methods for measurement and interpretation of results for power quality parameters in a.c. power supply systems with a declared fundamental frequency of 50 Hz or 60 Hz. Measurement methods are described for each relevant parameter in terms that give reliable and repeatable results, regardless of the method’s implementation. This standard addresses measurement methods for in-situ measurements. Measurement of parameters covered by this standard is limited to conducted phenomena in power systems. The power quality parameters considered in this standard are power frequency, magnitude of the supply voltage, flicker, supply voltage dips and swells, voltage interruptions, transient voltages, supply voltage unbalance, voltage harmonics and interharmonics, mains signalling on the supply voltage, rapid voltage changes, and current measurements. Emissions in the 2 kHz to 150 kHz range are considered in Annex C (informative), and over- and underdeviations are considered in Annex D (informative). Depending on the purpose of the measurement, all or a subset of the phenomena on this list may be measured. This third edition cancels and replaces the second edition published in 2008. This edition constitutes a technical revision”.

*Description from IEC website

Photo by Dilshan R Jayakody

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