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New Benchtop Systems for IC Temperature Testing

intestTwo benchtop systems for temperature testing integrated circuits including high-Watt emitting devices have been introduced by inTEST Thermal. The Temptronic® ThermoSpot® consists of a highly responsive benchtop temperature forcing unit that feeds a thermal probe head through a flexible umbilical. The thermal probe is designed with an interchangeable ThermoBridge™ to mate directly to an IC or other device under test creating a highly efficient thermally conductive path to quickly induce temperatures to the device, even under power.

Interfacing to the DUT is available for in-circuit and test socket applications. Connecting the thermal head to the DUT is made easy and precise through a quick lock-down mechanism on the thermal head.

Two models, DCP-1 and DCP-2, span a temperature range from -65 to 200°C. The DCP-1 provides cooling power of 25W at -40°C for lower power devices, while the DCP-2 provides a capacity to cool 55W at
-55°C and 120W at -40°C.

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A Dash of Maxwell’s: A Maxwell’s Equations Primer – Part Two

Maxwell’s Equations are eloquently simple yet excruciatingly complex. Their first statement by James Clerk Maxwell in 1864 heralded the beginning of the age of radio and, one could argue, the age of modern electronics.

A touch-screen controller permits user-programmable temperatures, graphing, data logging, and more. Using DUT control, with a thermocouple or diode, the system provides fast and precise transitions to temperature at the IC.

For more details see http://www.intestthermal.com/IC-DUT-conductive-temperature-forcing-DCP or contact the factory +1.781.688.2300.

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