A new revision of J1879 has been published by SAE International. J1879 is a “Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications.” The new revision is available for purchase on the SAE website.
“This document will primarily address intrinsic reliability of electronic components for use in automotive electronics. Where practical, methods of extrinsic reliability detection and prevention will also be addressed. The current handbook primarily focuses on integrated circuit subjects, but can easily be adapted for use in discrete or passive device qualification with the generation of a list of failure mechanisms relevant to those components. Semiconductor device qualification is the main scope of the current handbook. Other procedures addressing extrinsic defects are particularly mentioned in the monitoring chapter.”
*Description from SAE website